Browsing by Author "Wang, G."
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Publication Defect assessment and leakage control in Ge junctions
; ; ; ; Claeys, CorJournal article2014, Microelectronic Engineering, 125, p.33-37Publication In-Situ HCl etching of InP in shallow-trench-isolated structures
Journal article2012, Journal of the Electrochemical Society, (159) 4, p.H455-H459Publication In-Situ HCl etching of InP in shallow-trench-isolated structures
Proceedings paper2011, ULSI Process Integration 7, 9/10/2011, p.345-354Publication In-Situ HCl etching of InP in shallow-trench-isolated structures
Meeting abstract2011, 220th ECS Fall Meeting, 9/10/2011, p.2153Publication Integration of III-V on Si for high-mobility CMOS
Proceedings paper2012, International Silicon-Germanium Technology and Device Meeting - ISTDM, 4/06/2012Publication Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation
; Publication Selective area growth of InP on on-axis Si(001) substrates with low antiphase boundary formation
Proceedings paper2011, ULSI Process Integration 7, 9/10/2011, p.249-263Publication Selective area growth of InP and defect elimination on Si (001) substrates
Meeting abstract2011, 220th ECS Fall Meeting, 9/10/2011, p.2134