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Defect assessment and leakage control in Ge junctions
Publication:
Defect assessment and leakage control in Ge junctions
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gonzalez, M.B.
;
Simoen, Eddy
;
Eneman, Geert
;
De Jaeger, Brice
;
Wang, G.
;
Loo, Roger
;
Claeys, Cor
Journal
Microelectronic Engineering
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1884
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Acq. date: 2025-12-10
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Metrics
Views
1884
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-10
Citations