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Defect assessment and leakage control in Ge junctions
Publication:
Defect assessment and leakage control in Ge junctions
Date
2014
Journal article
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29987.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gonzalez, M.B.
;
Simoen, Eddy
;
Eneman, Geert
;
De Jaeger, Brice
;
Wang, G.
;
Loo, Roger
;
Claeys, Cor
Journal
Microelectronic Engineering
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1880
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1880
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations