Publication:
Defect assessment and leakage control in Ge junctions
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0001-8804-7556 | |
| cris.virtual.orcid | 0000-0002-5218-4046 | |
| cris.virtual.orcid | 0000-0002-5849-3384 | |
| cris.virtual.orcid | 0000-0003-3513-6058 | |
| cris.virtualsource.department | 2ff6b2d4-dc3e-4534-b09e-e1f7ecc1bc59 | |
| cris.virtualsource.department | 715a9ada-0798-46d2-a8ca-4775db9a8e46 | |
| cris.virtualsource.department | db73cf2d-2000-429c-bc92-553a1ef3e876 | |
| cris.virtualsource.department | 2d7dd015-fa43-4fbb-89fc-68f144075506 | |
| cris.virtualsource.orcid | 2ff6b2d4-dc3e-4534-b09e-e1f7ecc1bc59 | |
| cris.virtualsource.orcid | 715a9ada-0798-46d2-a8ca-4775db9a8e46 | |
| cris.virtualsource.orcid | db73cf2d-2000-429c-bc92-553a1ef3e876 | |
| cris.virtualsource.orcid | 2d7dd015-fa43-4fbb-89fc-68f144075506 | |
| dc.contributor.author | Gonzalez, M.B. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | De Jaeger, Brice | |
| dc.contributor.author | Wang, G. | |
| dc.contributor.author | Loo, Roger | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | De Jaeger, Brice | |
| dc.contributor.imecauthor | Loo, Roger | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
| dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
| dc.date.accessioned | 2021-10-22T01:40:18Z | |
| dc.date.available | 2021-10-22T01:40:18Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0167-9317 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23865 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S016793171400015X | |
| dc.source.beginpage | 33 | |
| dc.source.endpage | 37 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 125 | |
| dc.title | Defect assessment and leakage control in Ge junctions | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |