Browsing by Author "Wang, R."
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Publication A single device based Voltage Step Stress (VSS) technique for fast reliability screening
; ; ; Ren, P.Proceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.GD.2Publication On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective
; ; ; ; Proceedings paper2023, 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 07-10, 2023Publication Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Proceedings paper2016, IEEE Symposium on VLSI technology, 13/06/2016, p.32-33