Browsing by Author "Wang, W."
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Publication An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
;Zhou, L. ;Bo, T. ;Ji, Z. ;Yang, H. ;Xu, H. ;Liu, Q.; ;Wang, X. ;Ma, X. ;Li, Y. ;Yin, H.Du, A.Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96Publication Concept for a solid-state multiparameter sensor system for cell-culture monitoring
;Bäcker, M. ;Beging, S. ;Biselli, M. ;Poghossian, A. ;Wang, J. ;Wang, W. ;Wagner, PatrickSchöning, M.J.Journal article2009, Electrochimica Acta, (54) 25, p.6107-6112Publication Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
;Zhou, L. ;Liu, Q. ;Yang, H. ;Ji, Z. ;Xu, H. ;Tang, B.; ;Jiang, H. ;Luo, Y. ;Wang, X. ;Ma, X.Li, Y.Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 3, p.498-505Publication Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation
;Duan, N. ;Luo, J. ;Wang, G. ;Liu, J.; ;Mao, S. ;Radamson, H. ;Wang, X. ;Li, J. ;Wang, W.Zhao, C.Journal article2016, IEEE Transactions on Electron Devices, (63) 11, p.4546-4549Publication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
;Zhou, L. ;Zhang, Q. ;Yang, H. ;Ji, Z. ;Zhang, Z. ;Liu, Q. ;Xu, H. ;Tang, B.; ;Ma, X.Wang, X.Journal article2020, IEEE Electron Device Letters, (41) 7, p.965-968