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Browsing by Author "Wang, X."

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    16 QAM burst mode receiver for upstream communication over CATV networks

    Codenie, Jan
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    Wang, X.
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    Everaert, Alain
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    Lambrecht, Peter
    ;
    Vandewege, Jan
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    De Meyer, Kristin  
    Proceedings paper
    1998, Proceedings of the 40th Midwest Symposium on Circuits and Systems dedicated to the Memory of Professor Mac Valkenburg; 3-6 Augus, p.573-576
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    An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

    Zhou, L.
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    Bo, T.
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    Ji, Z.
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    Yang, H.
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    Xu, H.
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    Liu, Q.
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    Simoen, Eddy  
    ;
    Wang, X.
    ;
    Ma, X.
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    Li, Y.
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    Yin, H.
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    Du, A.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96
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    Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs

    Zhou, L.
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    Liu, Q.
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    Yang, H.
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    Ji, Z.
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    Xu, H.
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    Tang, B.
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    Simoen, Eddy  
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    Jiang, H.
    ;
    Luo, Y.
    ;
    Wang, X.
    ;
    Ma, X.
    ;
    Li, Y.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 3, p.498-505
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    Monolithic TCAD simulation of phase-change memory (PCM/PRAM) plus Ovonic Threshold Switch (OTS) selector device

    Thesberg, M.
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    Stanojevic, Z.
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    Baumgartner, O.
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    Kernstock, C.
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    Leonelli, D.
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    Barci, M.
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    Wang, X.
    Journal article
    2023, SOLID-STATE ELECTRONICS, (199) January, p.Art.: 108504
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    Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation

    Duan, N.
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    Luo, J.
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    Wang, G.
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    Liu, J.
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    Simoen, Eddy  
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    Mao, S.
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    Radamson, H.
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    Wang, X.
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    Li, J.
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    Wang, W.
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    Zhao, C.
    Journal article
    2016, IEEE Transactions on Electron Devices, (63) 11, p.4546-4549
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    Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs

    Zhou, L.
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    Zhang, Q.
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    Yang, H.
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    Ji, Z.
    ;
    Zhang, Z.
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    Liu, Q.
    ;
    Xu, H.
    ;
    Tang, B.
    ;
    Simoen, Eddy  
    ;
    Ma, X.
    ;
    Wang, X.
    Journal article
    2020, IEEE Electron Device Letters, (41) 7, p.965-968

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