Browsing by Author "Wang, Yunqi"
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Publication As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability
Journal article2014, Microelectronics Reliability, (54) 9_10, p.1675-1679Publication Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Journal article2014, Microelectronics Reliability, (54) 9_10, p.2258-2261