Browsing by Author "Watling, J."
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Publication TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology
;Norris, D.J. ;Walther, T. ;Cullis, A.G. ;Myronov, M. ;Dobbie, A. ;Whall, T.Parker, E.H.C.Journal article2010, Journal of Physics Conference Series, (209) 1, p.12061