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Browsing by Author "Watling, J."

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    TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology

    Norris, D.J.
    ;
    Walther, T.
    ;
    Cullis, A.G.
    ;
    Myronov, M.
    ;
    Dobbie, A.
    ;
    Whall, T.
    ;
    Parker, E.H.C.
    Journal article
    2010, Journal of Physics Conference Series, (209) 1, p.12061

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