Browsing by Author "Watté, J."
Now showing 1 - 10 of 10
- Results Per Page
- Sort Options
Publication A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
;Watté, J. ;Wuyts, Koen ;Silverans, R. E. ;Van Hove, MarleenVan Rossum, MarcJournal article1994, Journal of Applied Physics, 75, p.2055-2060Publication Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures
Journal article1994, Appl. Phys. Lett., 64, p.2406-2408Publication Correlation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs
;Lin, X. W. ;Watté, J. ;Wuyts, Koen ;Liliental-Weber, Z.Washburn, J.Proceedings paper1994, Advanced Metallization for Devices and Circuits : Science, Technology and Manufacturability; April 4-8, 1994; San Francisco, Cal, p.295-300Publication Demonstration of extended split APON
Proceedings paper2002, Proceedings of the Conference on Optical Fiber Communication - OFC, 17/03/2002, p.437-439Publication Laser cleaving of glass fibers and glass fiber arrays
Journal article2005-02, Journal of Lightwave Technology, (23) 2, p.609-614Publication Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
Oral presentation1995, Annual Meeting of the Belgian Physical Society; May 1995;Publication Solutions for extended split PON
Proceedings paper2001, Proceedings Symposium 6th IEEE/LEOS Benelux Chapter, 3/12/2001, p.145-148Publication Solutions for extended split PON
;Fredericx, F.; ;Bouchat, C. ;Watté, J. ;Van Overmeir, P. ;Vandewege, JanQiu, Xing ZhiProceedings paper2001, OHAN/FSAN2001 - Proceedings of the International Workshop on Optical Hybrid Access Networks - Full Service Access Networks, 4/04/2001, p.4.2-1-4.2-7Publication Study and demonstration of extensions to the standard FSAN BPON
;Vetter, P. ;Fredricx, F. ;Ringoot, E. ;Janssens, N. ;De Vos, B. ;Bouchat, C.Duthilleul, F.Proceedings paper2002, Proceedings of the 14th Int. Symposium on Services and Local Access, The Harmony of Innovation and Profit in Access, ISSLS, 14/04/2002, p.119-128Publication The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy
;Watté, J. ;Silverans, R. E. ;Münder, H. ;Palmstrøm, C. J. ;Florez, L. T.Van Hove, MarleenProceedings paper1994, Advanced Metallization for Devices and Circuits - Science, Technology and Manufacturing III, 04/04/1994, p.331-337