Browsing by Author "Weeks,"
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Publication Strain study in transistors with SiC and SiGe source and drain by STEM nano beam diffraction
; ;Klenov, Dmitri; ; ;Bauer, ;Weeks, ;Thomas,Proceedings paper2008-09, EMC. 14th European Microscopy Congress. Volume 2: Materials Science, 1/09/2008, p.15-16