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Browsing by Author "Weemaes, R.G.R."

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    Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells

    Tio Castro, David
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    Goux, Ludovic  
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    Hurkx, G.A.M.
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    Attenborough, Karen
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    Delhougne, Romain  
    Proceedings paper
    2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.315-318
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    Gatestacks for scalable high-performance FinFETs

    Vellianitis, Georgios  
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    Van Dal, Mark  
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    Witters, Liesbeth  
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    Curatola, Gilberto
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    Doornbos, Gerben  
    Proceedings paper
    2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.681-684
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    Highly manufacturable FinFETs with sub-10nm fin width and high aspect ratio fabricated with immersion lithography

    Van Dal, Mark  
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    Collaert, Nadine  
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    Doornbos, Gerben  
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    Vellianitis, Georgios  
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    Curatola, Gilberto
    Proceedings paper
    2007, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2007, p.110-111
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    Solid phase epitaxy versus random nucleation and growth in sub-20 nm wide fin field-effect transistors

    Duffy, Ray
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    Van Dal, Mark  
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    Pawlak, Bartek  
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    Kaiser, M.
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    Weemaes, R.G.R.
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    Degroote, Bart
    ;
    Kunnen, Eddy
    Journal article
    2007, Applied Physics Letters, (90) 24, p.241912

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