Browsing by Author "Wellard, C.J."
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Publication Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET
Journal article2008, Nature Physics, (4) 8, p.656-661Publication Transport-based dopant metrology in advanced FinFETs
Proceedings paper2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.713-716