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Browsing by Author "Whall, T.E."

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    The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal

    Beer, C.S.
    ;
    Whall, T.E.
    ;
    Parker, E.H.C.
    ;
    Leadley, D.R.
    ;
    De Jaeger, Brice  
    ;
    Nicholas, Gareth
    Proceedings paper
    2008, 9th International Conference on Ultimate Integration of Silicon - ULIS, 12/03/2008, p.19-22

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