Publication:
The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1900 since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1900 since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations