Browsing by Author "Whittaker, E."

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Detection of localised variation in the electronic properties of GaN grown by MOCVD and MBE using scanning tunneling microscopy

Hamilton, B.
;
Ferhah, K.
;
Davidson, J.
;
Dawson, P.
;
Whittaker, E.
;
Cheng, T. S.
;
Foxon, C. T.
Meeting abstract
1999, 3rd International Conference on Nitride Semiconductors - ICS3, 04/07/1999, p.131
Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon

Bernardini, S.
;
Ishii, M.
;
Whittaker, E.
;
Hamilton, B.
;
Freeland, C.
;
Poolton, N.R.J.
Journal article
2007, Microelectronic Engineering, (84) 9_10, p.2286-2289