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Detection of localised variation in the electronic properties of GaN grown by MOCVD and MBE using scanning tunneling microscopy
Publication:
Detection of localised variation in the electronic properties of GaN grown by MOCVD and MBE using scanning tunneling microscopy
Date
1999
Meeting abstract
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3449.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hamilton, B.
;
Ferhah, K.
;
Davidson, J.
;
Dawson, P.
;
Whittaker, E.
;
Cheng, T. S.
;
Foxon, C. T.
;
Bougrioua, Zahia
;
Thrush, E. J.
;
Harris, J. J.
;
Lee, K. J.
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Abstract
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1917
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1917
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations