Browsing by Author "Wimmer, Yannick"

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Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

Grasser, Tibor
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Waltl, Michael
;
Wimmer, Yannick
;
Goes, Wolfgang
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Kosik, R.
;
Rzepa, Gerhard
Proceedings paper
2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.535-538
On the importance of electron-electron scattering for hot-carrier

Tyaginov, Stanislav
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Bina, Markus
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Franco, Jacopo
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Wimmer, Yannick
;
Kaczer, Ben
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Grasser, Tibor
Journal article
2015, Japanese Journal of Applied Physics, (54) 4S, p.04DC18