Browsing by Author "Wirth, G."
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Publication Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
Journal article2014, Microelectronics Reliability, (54) 11, p.2364-2370Publication Use of SSTA tools for evaluating BTI impact on combinational circuits
Journal article2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (22) 2, p.280-285