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Articles
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
Publication:
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Camargo, V. V. A.
;
Kaczer, Ben
;
Grasser, T.
;
Wirth, G.
Journal
Microelectronics Reliability
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Metrics
Views
1857
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2025-12-11
Citations