Publication:
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
Date
| dc.contributor.author | Camargo, V. V. A. | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Grasser, T. | |
| dc.contributor.author | Wirth, G. | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-22T00:51:35Z | |
| dc.date.available | 2021-10-22T00:51:35Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23601 | |
| dc.identifier.url | http://dx.doi.org/10.1016/j.microrel.2014.06.003 | |
| dc.source.beginpage | 2364 | |
| dc.source.endpage | 2370 | |
| dc.source.issue | 11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 54 | |
| dc.title | Circuit simulation of workload-dependent RTN and BTI based on trap kinetics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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