Browsing by Author "Wirth, Gilson"
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Publication Atomistic approach to variability of bias-temperature instability in circuit simulations
Proceedings paper2011-04, IEEE International Reliability Physics Symposium - IRPS, 10/04/2011, p.915-919Publication Fast and accurate statistical characterization of standard cell libraries
Journal article2011, Microelectronics Reliability, (51) 12, p.2341-2350Publication Statistical characterization of standard cells using design of experiments and response surface modelling
Proceedings paper2011, 48th Design Automation Conference - DAC, 5/06/2011, p.77-82Publication Statistical model for MOSFET bias temperature instability component due to charge trapping
Journal article2011, IEEE Transactions on Electron Devices, (58) 8, p.2743-2751