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Atomistic approach to variability of bias-temperature instability in circuit simulations
Publication:
Atomistic approach to variability of bias-temperature instability in circuit simulations
Date
2011-04
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Mahato, Swaraj
;
Valduga de Almeida Camargo, Vinicius
;
Toledano Luque, Maria
;
Roussel, Philippe
;
Grasser, Tibor
;
Catthoor, Francky
;
Dobrovolny, Petr
;
Zuber, Paul
;
Wirth, Gilson
;
Groeseneken, Guido
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2022
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
2022
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations