Publication:

Atomistic approach to variability of bias-temperature instability in circuit simulations

Date

2011-04
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorMahato, Swaraj
dc.contributor.authorValduga de Almeida Camargo, Vinicius
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGrasser, Tibor
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorZuber, Paul
dc.contributor.authorWirth, Gilson
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorMahato, Swaraj
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.date.accessioned2021-10-19T14:41:17Z
dc.date.available2021-10-19T14:41:17Z
dc.date.embargo9999-12-31
dc.date.issued2011-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19148
dc.source.beginpage915
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage919
dc.title

Atomistic approach to variability of bias-temperature instability in circuit simulations

dc.typeProceedings paper
dspace.entity.typePublication
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