Browsing by Author "Woerlee, P. H."
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Publication Current-voltage characteristics of gate oxides after hard breakdown
Proceedings paper2001, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials - SSDM;, p.212-213Publication Modelling of crystal originated particles and their impact on gate oxide integrity
Proceedings paper2002, Semiconductor Silicon 2002. Proceedings of the 9th International Symposium on Silicon Materials Science and Technology, 12/05/2002, p.528-539