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Browsing by Author "Woicik, J."

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    Chemical profiling with photoemission: a comparison between angle-resolved XPS and high-energy photoemission on full gate stacks

    Conard, Thierry  
    ;
    Schram, Tom  
    ;
    Adelmann, Christoph  
    ;
    Woicik, J.
    Meeting abstract
    2011, 4th International Workshop on Hard X-ray Photoelectron Spectroscopy - HAXPES, 14/09/2011

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