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Browsing by Author "Wristers, D."

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    Ultra thin oxide reliability : effects of gate doping concentration and poly-Si.SiO2 interface stress relaxation

    Wristers, D.
    ;
    Wang, Hui
    ;
    De Wolf, Ingrid  
    ;
    Han, L. K.
    ;
    Kwong, D. L.
    ;
    Fulford, J.
    Proceedings paper
    1996, International Reliability Physics Symposium - IRPS, 29/04/1996, p.77-83

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