Browsing by Author "Wu, Qian"

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A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

Wu, Qian
;
Bayerl, A.
;
Porti, Marc
;
Martin-Martinez, Javier
;
Lanza, Mario
;
Rodiguez, Rosanna
Journal article
2014, IEEE Transactions on Electron Devices, (61) 9, p.3118-3124
Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Wu, Qian
;
Porti, Marc
;
Bayerl, Albin
;
Martin-Martinez, Javier
;
Rodriguez, Rosana
Journal article
2015, Journal of Vacuum Science and Technology B, (33) 2, p.22202