Browsing by Author "Wu, T. -L."
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Publication Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30