Publication:

Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs

Date

2022
Proceedings Paper
https://doi.org/10.1109/IEDM45625.2022.10019357
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Author(s)

Sandupatla, Abhinay  
;
Wu, Wei-Min  
;
Shih, Chun-An  
;
Chen, Shih-Hung  
;
Sibaja-Hernandez, Arturo  
;
Parvais, Bertrand  
;
Peralagu, Uthayasankaran  
;
Alian, AliReza  
;
Wu, T. -L.
;
Ker, M. -D.
;
Groeseneken, Guido  
;
Collaert, Nadine  

Journal

na

Abstract

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1230 since deposited on 2023-05-25
Acq. date: 2025-10-26

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1230 since deposited on 2023-05-25
Acq. date: 2025-10-26

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