Publication:

Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs

Date

2022

Proceedings Paper

https://doi.org/10.1109/IEDM45625.2022.10019357

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Author(s)

Sandupatla, Abhinay

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Chen, Shih-Hung

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Sibaja-Hernandez, Arturo

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Parvais, Bertrand

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Peralagu, Uthayasankaran

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Groeseneken, Guido

;

Collaert, Nadine

Journal

na

Metrics

1230 since deposited on 2023-05-25

Acq. date: 2025-12-16