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Browsing by Author "Wu, T. L."

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    Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue

    Celano, Umberto  
    ;
    Chen, Yi-Hsuan  
    ;
    Minj, Albert  
    ;
    Banerjee, Kaustuv  
    ;
    Ronchi, Nicolo  
    Proceedings paper
    2020, IEEE Symposium on VLSI Technology and Circuits, JUN 15-19, 2020

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