Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
Publication:
Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
Copy permalink
Date
2020
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Chen, Yi-Hsuan
;
Minj, Albert
;
Banerjee, Kaustuv
;
Ronchi, Nicolo
;
McMitchell, Sean
;
Van Marcke, Patricia
;
Favia, Paola
;
Wu, T. L.
;
Kaczer, Ben
;
Van den Bosch, Geert
;
Van Houdt, Jan
;
van der Heide, Paul
Journal
na
Abstract
Description
Metrics
Views
1836
since deposited on 2021-11-02
3
last month
3
last week
Acq. date: 2025-12-16
Citations
Metrics
Views
1836
since deposited on 2021-11-02
3
last month
3
last week
Acq. date: 2025-12-16
Citations