Publication:
Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
Date
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.author | Chen, Yi-Hsuan | |
| dc.contributor.author | Minj, Albert | |
| dc.contributor.author | Banerjee, Kaustuv | |
| dc.contributor.author | Ronchi, Nicolo | |
| dc.contributor.author | McMitchell, Sean | |
| dc.contributor.author | Van Marcke, Patricia | |
| dc.contributor.author | Favia, Paola | |
| dc.contributor.author | Wu, T. L. | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | van der Heide, Paul | |
| dc.contributor.imecauthor | Celano, U. | |
| dc.contributor.imecauthor | Chen, Y. H. | |
| dc.contributor.imecauthor | Minj, A. | |
| dc.contributor.imecauthor | Banerjee, K. | |
| dc.contributor.imecauthor | Ronchi, N. | |
| dc.contributor.imecauthor | McMitchell, S. | |
| dc.contributor.imecauthor | Van Marcke, P. | |
| dc.contributor.imecauthor | Favia, P. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Van den Bosch, G. | |
| dc.contributor.imecauthor | Van Houdt, J. | |
| dc.contributor.imecauthor | van der Heide, P. | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.imecauthor | Chen, Yi-Hsuan | |
| dc.contributor.imecauthor | Minj, Albert | |
| dc.contributor.imecauthor | Banerjee, Kaustuv | |
| dc.contributor.imecauthor | Ronchi, Nicolo | |
| dc.contributor.imecauthor | McMitchell, Sean | |
| dc.contributor.imecauthor | Van Marcke, Patricia | |
| dc.contributor.imecauthor | Favia, Paola | |
| dc.contributor.orcidimec | Celano, U.::0000-0002-2856-3847 | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.contributor.orcidimec | Minj, Albert::0000-0003-0878-3276 | |
| dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
| dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
| dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
| dc.contributor.orcidimec | van der Heide, Paul::0000-0001-6292-0329 | |
| dc.date.accessioned | 2022-01-20T10:04:45Z | |
| dc.date.available | 2021-11-02T15:59:26Z | |
| dc.date.available | 2022-01-20T10:04:45Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-6460-1 | |
| dc.identifier.issn | 0743-1562 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37750 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE Symposium on VLSI Technology and Circuits | |
| dc.source.conferencedate | JUN 15-19, 2020 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.journal | na | |
| dc.source.numberofpages | 2 | |
| dc.title | Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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