Browsing by Author "Wu, Xing"

Now showing 1 - 4 of 4

Oxygen soluble gate electrodes for prolonged high-kappa gate-stack reliability

Raghavan, Nagarajan
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Pey, Kin Leong
;
Wu, Xing
;
Liu, Wenhu
;
Li, Xiang
;
Bosman, Bosman
Journal article
2011, IEEE Electron Device Letters, (32) 3, p.252-254
Physical analysis of beakdown in High-k /metal gate stacks using TEM/EELS and STM for relibaility enhancement

Pey, Kin Leong
;
Raghavan, Nagarajan
;
Wu, Xing
;
Liu, Wenhu
;
Li, Xiang
;
Bosman, Michel
Journal article
2011, Microelectronic Engineering, (88) 7, p.1365-1372
Random telegraph noise reduction in metal gate high-k stacks by bipolar switching and the performance boosting technique

Liu, Wenhu
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Pey, Kin Leong
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Raghavan, Nagarajan
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Wu, Xing
;
Bosman, Michel
;
Kauerauf, Thomas
Proceedings paper
2011, IEEE International Reliability Physics Symposium - IRPS, 10/04/2011, p.182-189
Very low reset current for an RRAM device achieved in the oxygen-vacancy-controlled regime

Raghavan, Nagarajan
;
Pey, Kin Leong
;
Li, Xiang
;
Liu, Wenhu
;
Wu, Xing
;
Bosman, Michel
Journal article
2011, IEEE Electron Device Letters, (32) 6, p.716-718