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Browsing by Author "Wunderlich, Joachim"

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    Publication

    Device aging: A reliability and security concern

    Kraak, Daniel
    ;
    Mottaqiallah, Taouil
    ;
    Hamdioui, Said
    ;
    Weckx, Pieter  
    ;
    Catthoor, Francky  
    Proceedings paper
    2018, IEEE 23rd European Test Symposium (ETS), 28/05/2018, p.1-10

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