Browsing by Author "Xing, Guo"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs
Journal article2015-09, IEEE Transactions on Device and Materials Reliability, (15) 3, p.352-357