Browsing by Author "Xu, Tianhan"
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Publication Interfacial Properties of nMOSFETs With Different Al2O3 Capping Layer Thickness and TiN Gate Stacks
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 3, p.948-953Publication Temperature-Dependent Electrical Properties of nMOSFETs With Different Thickness Al2O3 Capping Layer and TiN Gate
; ; Claeys, CorJournal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 12, p.6020-6025