Browsing by Author "Xu, X."

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A systematic study of trade-offs in engineering a locally strained pMOSFET

Nouri, Faran
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Verheyen, Peter
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Washington, Lori
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Moroz, Victor
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De Wolf, Ingrid
;
Kawaguchi, S.
Proceedings paper
2004, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.1055-1058
Modeling copper plastic deformation and liner viscoelastic flow effects on performance and reliability in Through Silicon Via (TSV) fabrication processes

Karmarkar, A.P.
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Xu, X.
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El Sayed, K.
;
Guo, Wei
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Van der Plas, Geert
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Van Huylenbroeck, Stefaan
Journal article
2019, IEEE Transactions on Device and Materials Reliability, (19) 4, p.642-653