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Modeling copper plastic deformation and liner viscoelastic flow effects on performance and reliability in Through Silicon Via (TSV) fabrication processes
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Modeling copper plastic deformation and liner viscoelastic flow effects on performance and reliability in Through Silicon Via (TSV) fabrication processes
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Karmarkar, A.P.
;
Xu, X.
;
El Sayed, K.
;
Guo, Wei
;
Van der Plas, Geert
;
Van Huylenbroeck, Stefaan
;
Gonzalez, Mario
;
Absil, Philippe
;
Beyne, Eric
Journal
IEEE Transactions on Device and Materials Reliability
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1956
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-15
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Metrics
Views
1956
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-15
Citations