Browsing by Author "Yan, Pei-Yang"
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Publication Impact of EUV mask surface roughness on LER
Proceedings paper2012, Extreme Ultraviolet (EUV) Lithography III, 12/02/2012, p.83220NPublication Mask effects on resist variability in extreme ultraviolet lithography
Journal article2013, Japanese Journal of Applied Physics, (52) 6, p.03GC02