Browsing by Author "Yao, T."
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Publication Method for endurance optimization of the HIMOStm flash memory cell in a 90nm CMOS technology
Proceedings paper2005, 43rd Annual IEEE International Reliability Physics Symposium Proceedings, 17/04/2005, p.662-663Publication Plasma damage in HIMOSTM non-volatile memories (NVM)
Proceedings paper2004-05, IEEE International Conference on Integrated Circuit Design and Technology - ICICDT, 17/05/2004, p.223-226