Browsing by Author "Yin, H."
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Publication An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
;Zhou, L. ;Bo, T. ;Ji, Z. ;Yang, H. ;Xu, H. ;Liu, Q.; ;Wang, X. ;Ma, X. ;Li, Y. ;Yin, H.Du, A.Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96Publication Functionalization of CVD diamond films and diamond single crystals for biosensor applications
Oral presentation2012, Hasselt Diamond Workshop - SBDD XVIIPublication High-quality cubic BN thin films prepared by rf magnetron sputtering without argonion bombardment
Oral presentation2012, Hasselt Diamond Workshop - SBDD XVIIPublication Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
;Zhou, L. ;Liu, Q. ;Yang, H. ;Ji, Z. ;Xu, H. ;Tang, B.; ;Jiang, H. ;Luo, Y. ;Wang, X. ;Ma, X.Li, Y.Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 3, p.498-505Publication Mechanical and tribological properties of epitaxial cubic boron nitride thin films grown on diamond
;Deyneka-Dupriez, N. ;Herr, U. ;Fecht, H.J. ;Zhang, X.W. ;Yin, H.Boyen, H.G.Journal article2008, Advanced Engineering Materials, (10) 5, p.482-487Publication Phase separation of ethanol-water solutions at diverse terminated diamond surfaces
Oral presentation2012, Int. Union of Materials Research Societies - Int. Conf. on Electronic Materials - IUMRS-ICEMPublication Phase separation of ethanol-water solutions at diverse terminated diamond surfaces
Oral presentation2012, E-MRS Spring MeetingPublication Purity of epitaxial cubic BoronNitride films on (001) Diamond - A prerequisite for their doping
;Yin, H. ;Boyen, H.G. ;Ziemann, P. ;Dohuard, B. ;Houssiau, L. ;Renaux, F. ;Hecq, M.Bittencourt, C.Journal article2008, Diamond and Related Materials, (17) 3, p.276-282Publication The influence of diamond surface termination on the phase separation of ethanol-water solutions
Oral presentation2012, 6th International Conference on New Diamond and Nano Carbons - NDNCPublication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
;Zhou, L. ;Zhang, Q. ;Yang, H. ;Ji, Z. ;Zhang, Z. ;Liu, Q. ;Xu, H. ;Tang, B.; ;Ma, X.Wang, X.Journal article2020, IEEE Electron Device Letters, (41) 7, p.965-968