Browsing by Author "Yin, KaiMin"
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Achieving conduction band-edge effective work functions by La2O3 capping of hafnium silicates
Journal article2007-06, IEEE Electron Device Letters, (28) 6, p.486-488Publication Effects of Al2O3 dielectric cap and nitridation on device performance, scalability, and reliability for advanced high-k/metal gate pMOSFET applications
Journal article2007, IEEE Trans. Electron Devices, (54) 10, p.2378-2748