Browsing by Author "Yoneoka, Masashi"

Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs

Increased radiation hardness of short-channel electron-irradiated Si1-xGex source/drain p-type metal oxide semiconductor field-effect transistors at higher Ge content

Thermal recovery process of electron irradiated Si1-xCx source/drain n-MOSFETs