Publication:
Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs
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2033 since deposited on 2021-10-20
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Acq. date: 2026-02-25
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2033 since deposited on 2021-10-20
2last month
2last week
Acq. date: 2026-02-25
Citations