Browsing by Author "Yoshino, K."

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Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations

Nakashima, T.
;
Idemoto, T.
;
Tsunoda, I.
;
Takakura, K.
;
Yoneoka, M.
;
Ohyama, H.
;
Yoshino, K.
Journal article
2012, Thin Solid Films, 520, p.3337-3340
Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior

Nakashima, T.
;
Idemoto, T.
;
Takakura, K.
;
Tsunoda, I.
;
Yoneoka, M.
;
Ohyama, H.
;
Yoshino, K.
Proceedings paper
2010, 2nd Semiconductor Materials and Devices Forum - SMDF-2, 11/12/2010, p.56-59