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Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior
Publication:
Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nakashima, T.
;
Idemoto, T.
;
Takakura, K.
;
Tsunoda, I.
;
Yoneoka, M.
;
Ohyama, H.
;
Yoshino, K.
;
Bargallo Gonzalez, Mireia
;
Simoen, Eddy
;
Eneman, Geert
;
Claeys, Cor
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1997
since deposited on 2021-10-18
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Acq. date: 2025-12-09
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Views
1997
since deposited on 2021-10-18
1
last month
1
last week
Acq. date: 2025-12-09
Citations