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Browsing by Author "Yu, David"

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    Challenges in BEOL cleaning for the 10 nm node and beyond

    Yu, David
    ;
    Le, Quoc Toan  
    ;
    Braun, Simon  
    ;
    Kesters, Els  
    ;
    Shen, Mary
    ;
    Klipp, Andreas
    ;
    Holsteyns, Frank  
    Meeting abstract
    2014, Sematech Surface Preparation and Cleaning Conference, 22/04/2014
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    Wet clean in BEOL interconnect: Post etch residue removal and material compatibility

    Kesters, Els  
    ;
    Le, Quoc Toan  
    ;
    Yu, David
    ;
    Shen, Mary
    ;
    Braun, Simon  
    ;
    Klipp, Andreas
    ;
    Holsteyns, Frank  
    Proceedings paper
    2014, Ultra Clean Processing of Semiconductor Surfaces - UCPSS XII, 21/09/2014, p.201-204

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