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Browsing by Author "Yu, H.Y"

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    High-k/ metal-gate stack work-function tuning by rare-earth capping layers: interface dipole or bulk charge?

    Yu, H.Y
    ;
    Chang, S.Z.
    ;
    Aoulaiche, Marc
    ;
    Kaczer, Ben  
    ;
    Absil, Philippe  
    ;
    Adelmann, Christoph  
    Proceedings paper
    2009, International Symposium on VLSI Technology, Systems, and Applications - VLSI-TSA, 27/04/2009, p.69-70

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