Browsing by Author "Zakel, Julia"
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Publication Hybrid SIMS: New possibilities for advanced semiconductor structure analysis with self-focusing SIM
Proceedings paper2019, Festkörperanalytik - Conference on Solid State Analysis, 1/07/2019Publication Hybrid SIMS: New possibilities for advanced semiconductor structure analysis with Self-Focusing SIMS
Proceedings paper2019, ECASIA (European Conference on Applications for Surface and Interface Analysis), 15/09/2019Publication New possibilities for advanced semiconductor structure analysis by combining SIMS with SPM and high performance mass spectrometry
Oral presentation2020, Microscopy & Microanalysis 2020 Meeting