Browsing by Author "Zhang, E. X."
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Publication Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Journal article2019, Applied Physics Letters, (114) 20, p.203501Publication Physical mechanisms of charge pumping and DCIV currents in floating-body SOI MOSFETs
Meeting abstract2012-10, ECS Fall Meeting Symposium E6: high Purity Silicon 12, 7/10/2012, p.2641